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Welcome to Shumotek

Jun 27, 2018

KREIOS 150


KREIOS 150

next Generation Electron Analyzer
for small spot arpes and momentum mIcroscopy

KEY FEATURES

• full 180° angle arpes
• µarpes (< 2 µm field of view)
• extractor zoom lens design
• Kinetic energy range 0-1500 ev
• energy resolution < 15 mev
• angle resolution < 0.1°


Category: News-EN
Posted by: administrator

The new KREIOS 150


Laboratory solutions for ARPES need to be flexible and reliable. Classical (passive) hemispherical analyzers for PES are a well established and well understood technology. The logical next step is to combine a hemispherical analyzer with the new PEEM lens approach. The result is the SPECS KREIOS 150. Independent from the used light source it accesses the full photo electron emission-hemisphere (±90°).

The core of the lens is the patented extractor lens, with high HV stability and optimized performance for electron momentum spectroscopy and microscopy. The lens system produces reciprocal and real space images inside and at the exit of the lens. Apertures in the corresponding back-focal and Gaussian planes allow for selective spectroscopy (µARPES) or true photoelectron emission microscopy mode. A hemispherical analyzer needs an entrance to select the k-vectors for energy dispersion. As a result, the second dimension in the reciprocal space needs to be scanned in order to obtain a 3D data set. The lens includes scanning options to map the k-vector of the emitted photoelectrons in the second k-direction.

Real space images will be obtained by a similar mechanism inside the PEEM lens, scanning the lateral resolved 1D profile along a second dimension above the entrance slit.

The analyzer comes with a highly precise power supply HSA 3500plus. As detectors either a 2D-CCD or a 2D-DLD detector can be chosen. For spin-resolved measurements a direct imaging spin detector (DiSpin) is available.

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